The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2002

Filed:

Oct. 05, 1998
Applicant:
Inventors:

Satoshi Umezu, Tokyo, JP;

Takahiro Yamaguchi, Tokyo, JP;

Jun Miyajima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/122 ;
U.S. Cl.
CPC ...
G06F 1/122 ;
Abstract

There is disclosed a testing system for performing an operation of an application which controls testing equipment for testing a device under test by displaying images such as icons or buttons on a screen, and selecting these images with use of a pointing device, and a method for controlling the testing system. An icon corresponding to the device under test and an icon corresponding to a test element are displayed, and then connected and displayed. In addition, a test parameter is generated corresponding to each test element, a test is conducted by setting respective test parameters, and obtained test data is displayed.


Find Patent Forward Citations

Loading…