The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2002

Filed:

Sep. 25, 1998
Applicant:
Inventors:

Man-Kit Yau, Tigard, OR (US);

Nikhil M. Deshpande, Beaverton, OR (US);

Kyle L. Bernard, Tigard, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/700 ; H04L 2/712 ;
U.S. Cl.
CPC ...
H04B 1/700 ; H04L 2/712 ;
Abstract

A frequency spectrum measurement apparatus sweeps a desired frequency range using multiple scan lines. A controller provides a non-contiguous sequence of input values to a frequency synthesizer operating as a local oscillator for generating a non-contiguous frequency output signal over the desired frequency range with each value offsetting a current frequency output signal from a previous frequency output signal. A mixer receives an input signal and the variable frequency synthesizer signal for generating an intermediate frequency signal that is filtered through a bandpass filter. The power of the intermediate frequency signal output of the bandpass filter is measured and displayed. The frequency spectrum measurement apparatus is usable in measuring out of channel emissions of a terrestrial RF broadcast digital television signal.


Find Patent Forward Citations

Loading…