The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2002
Filed:
May. 19, 1999
Toshikazu Suzuki, Tokyo, JP;
Hiroyuki Nagai, Tokyo, JP;
Noriyoshi Kozuka, Tokyo, JP;
Yukio Ishigaki, Tokyo, JP;
Shigeru Matsumura, Tokyo, JP;
Takashi Sekizuka, Tokyo, JP;
Hiroyuki Shiotsuka, Tokyo, JP;
Hiroyuki Hama, Tokyo, JP;
Eiichi Sekine, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A calibration method for calibrating a semiconductor testing apparatus before mounting semiconductor devices for performing a testing of electric characteristics thereof, the testing apparatus having a driver which generates and outputs a signal, and a socket with a plurality of terminals for receiving pins and transferring signals therethrough. The calibration method includes mounting a test board having a plurality of pins onto the socket and connecting each of the pins of the test board with a respective terminal of the socket, transferring the signal of the driver to the terminals of the test board, detecting the signal of the driver that has reached the test board, and setting an output timing of the signal of the driver based on the signal detected.