The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2002

Filed:

Mar. 10, 2000
Applicant:
Inventors:

Hideaki Abe, Tokyo-To, JP;

Yuuichiro Yamazaki, Tokyo-To, JP;

Motosuke Miyoshi, Tokyo-To, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ; G01N 2/300 ; G21K 5/08 ;
U.S. Cl.
CPC ...
G01N 2/100 ; G01N 2/300 ; G21K 5/08 ;
Abstract

There is here disclosed charged particle beam apparatus in which reactant floating in vacuum can efficiently be removed by simple structure. The charged particle beam apparatus of the present invention comprises a pulse tube refrigerator, a refrigerator controller for controlling the refrigerator, a compressor, a high-pressure rotary valve, a low-pressure rotary valve, and an active damper for removing vibration generated in the refrigerator. Since a cold section is disposed between an objective lens and a specimen in a vacuum container, and adsorbs the reactant in the vacuum container, the amount of reactant in the vacuum container can be reduced, the errors of the critical dimension value of a critical dimension SEM are reduced, and measurement precision is improved. Moreover, since a pulse tube is used as the refrigerator for cooling the cold section, the structure of the apparatus can be simplified and miniaturized. Accordingly, the vibration can be suppressed, and the measurement precision can be enhanced, maintenance can be facilitated, and a running cost can be reduced.


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