The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2002

Filed:

Nov. 01, 2000
Applicant:
Inventors:

Michael F. Meehan, Southbury, CT (US);

David G. Taub, Stamford, CT (US);

Jorge S. Ivaldi, Trumbull, CT (US);

Assignee:

ASML, US, Inc., Wilton, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/600 ; H01S 3/08 ; H01L 4/106 ;
U.S. Cl.
CPC ...
G02B 2/600 ; H01S 3/08 ; H01L 4/106 ;
Abstract

Active compensation of aberrations in an optical system involves attaching first and second force bars to a mirror. The first force bar is bifurcated to form an opening near its longitudinal midpoint. This opening defines first and second opposed surfaces. A second force bar is substantially perpendicular to the first force bar and extends through the opening of the first force bar so that a medial portion of the second force bar is disposed in the opening of the first force bar. The second force bar is connected to the first surface by at least one actuator. Longitudinal movement of the actuator causes a displacement of the mirror. A support structure is used to support the weight of the force bars and actuator. The force bars are connected to the support structure by a plurality of flexures. A control module receives information from a sensing module and controls the actuator. Other embodiments use more than two force bars and are capable of more fully compensating for any aberrations in the optical system.


Find Patent Forward Citations

Loading…