The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2002
Filed:
Aug. 28, 2001
Anritsu Corporation, Tokyo, JP;
Abstract
A reference signal generation portion generates a reference signal independently of a repetition cycle of a signal under test. A frequency measuring portion measures a repetition frequency of the signal under test by using a reference signal from the reference signal generation portion. A sampling frequency setting portion computes and sets a value of frequency of a sampling signal which can obtain a desired delay time with respect to a phase of the signal under test based on a value of a repetition frequency measured with the frequency measuring portion. The sampling signal generation portion uses a reference signal from the reference signal generation portion and the value of the frequency set by the sampling frequency setting portion to generate a sampling signal having a cycle corresponding to the frequency.