The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2002

Filed:

Feb. 12, 1999
Applicant:
Inventor:

Takeo Miura, Tatebayashi, JP;

Assignee:

Advantest Corp., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract

A comparator circuit includes a window high impedance detector which detects any glitches or fails in the high impedance state of the device under test (DUT) within a specified time range. The comparator circuit includes a first analog comparator for receiving an output signal of the DUT and comparing the output signal with a high threshold voltage, a second analog comparator for receiving the output signal of the DUT and comparing the output signal with a low threshold voltage, and a window high impedance detector for detecting a deviation from a high impedance state of the DUT throughout a specified time range and for producing a fail signal when the deviation is detected.


Find Patent Forward Citations

Miura, Takeo. (2002). Comparator circuit for semiconductor test system (U.S. Patent No. 6401225). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6401225

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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