The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2002
Filed:
Sep. 22, 2000
Marc A. Gessford, Hillsboro, OR (US);
Mark W. Nightingale, Washougal, WA (US);
Gary W. Reed, Beaverton, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A probe tip adapter for a measurement probe has at least a first electrically conductive element with a bore at one end and a probing contact formed on the other end. The bore of the electrically conductive element has an electrically conductive elastomer disposed therein having sufficient tensile strength, compression set, hardness, deflection force, elongation and percent recovery for repeatably securing the electrically conductive element to the probing tip of the measurement probe. An element holder is positionable on the measurement probe and has a cavity formed in one end for receiving the measurement probe. At least a first bore is formed in the other end of the element holder extending to the cavity and aligned with the probing tip of the measurement probe. The electrically conductive element is positioned in the holder bore such that the probing tip penetrates the elastomer and the probing contact extends from the holder. The probing contact may be configured as a probing tip having a shaft that tapers at one end to a point and as a square pin adapter with a bore formed in the electrically conductive element that receives a spring contact. The probe tip adapter is useable with both single ended and differential measurement probes.