The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2002
Filed:
Jul. 12, 1999
Fouriers Tseng, Hsin-Chu, TW;
Chin-Kai Liu, Taichung, TW;
Taiwan Semiconductor Manufacturing Company, Hsin-Chu, TW;
Abstract
A method/system is provided for performing a design review checking operation and analyzing the resultant data. Perform a DRC operation describing chip features and generating flags for violation sites including patterns and paths. Execute pattern analysis and grade classification steps for the violation sites. Generate a vector array for each chip feature for each of the violation sites. Compare the vector arrays to determine whether degrees of similarity of geometries of chip features of violation sites meet one of a set of criteria. Classify the violation sites into classes with similar criteria. Select representative arrays from each class of violation sites to provide an output. Calculate distance from a violation site from the origin in a two-dimensional array. Give a grade to each vector array to indicate the level of seriousness of the rule violation by the site. Use a layout viewer to view the error flags generated by pattern analysis and grade classification steps.