The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2002

Filed:

Oct. 23, 2000
Applicant:
Inventors:

Alessandro Cesare Callegari, Yorktown Heights, NY (US);

Fuad Elias Doany, Katonah, NY (US);

Evgeni Petrovich Gousev, Mahopac, NY (US);

Theodore Harold Zabel, Yorktown Heights, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/131 ; H01L 2/1469 ; H01L 2/126 ;
U.S. Cl.
CPC ...
H01L 2/131 ; H01L 2/1469 ; H01L 2/126 ;
Abstract

Within: (1) a method for purifying a metal oxide layer; and (2) a method for forming with enhanced purity a metal oxide layer, there is employed an irradiation of either: (1) a metal oxide layer; or (2) a substrate in the presence of at least one of an oxidant and a metal source material, such as to either: (1) reduce a concentration of a contaminant material within a metal oxide base material from which is formed a metal oxide layer; or (2) inhibit in a first instance formation of a contaminant material within a metal oxide layer. The metal oxide layer having incorporated therein the reduced concentration of contaminant material is particularly useful as a capacitive dielectric layer within a capacitive device within a microelectronic fabrication.

Published as:

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