The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2002
Filed:
Dec. 21, 2000
Johannes Cornelis Jans, Eindhoven, NL;
Marinus Willem Dirken, Almelo, NL;
Waltherus Wilhelmus Van Den Hoogenhof, Almelo, NL;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
The invention relates to a device for X-ray analysis with energy dispersive detection of fluorescent radiation. In order to enable the measurements to be carried out with a suitable position resolution, the analyzing radiation is conducted to the sample ( ) by means of an X-ray conducting capillary ( ) which is directed to the sample through the detector surface ( ). Practically all fluorescent radiation ( ) from the sample can be detected in such arrangement. According to the invention a detector is used in the form of an X-ray-sensitive CCD array ( ). Such a CCD array provides a better energy resolution in comparison with conventional EDX detectors. Moreover, for such CCD arrays a large amount of sophisticated software is available for reading out; moreover, such CCDs can be readily purchased, for example, as rejected visible light sensitive arrays in which a small number of pixels have dropped out.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile