The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2002
Filed:
Dec. 07, 2000
XCounter AB, Danderyd, SE;
Abstract
A method and apparatus for radiography and also a detector for detecting incident radiation. In the method and the apparatus X-rays ( ) are emitted from an X-ray source ( ). The X-rays which have interfered with an object to be imaged are detected ( ) in a detector ( ). The detector ( ), which detects incident radiation includes a gaseous avalanche chamber, including electrode arrangements between which a voltage is applied for creating an electrical field, which causes electron-ion avalanches of primary and secondary ionization electrons released by incident radiation. The detector detects electrical signals in at least two detector electrode modules, the electrical signals being induced by electron-ion avalanches, in at least one of a plurality of detector electrode elements arranged adjacent to each other, each along a direction essentially parallel to the incident radiation, and where the at least two independent detector electrode modules are arranged along a direction essentially parallel to the incident radiation.