The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2002
Filed:
Jun. 08, 1999
Applicant:
Inventors:
Joseph H. Salmon, Placerville, CA (US);
John T. Maddux, Folsom, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/130 ;
U.S. Cl.
CPC ...
G01R 3/130 ;
Abstract
A method and circuit to test for defects in the input path of an integrated circuit by providing a logic pattern data to a scan chain of the integrated circuit and testing setup and hold timing parameters. The method including determining a maximum value for a timing parameter and generating a data pattern with the timing parameter having the maximum value. The method also including monitoring an output of a logic function performed on the data pattern and adjusting the value of the timing parameter based on the output of the logic function.