The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2002

Filed:

Apr. 01, 1999
Applicant:
Inventor:

Donald Lawrence White, Morris Plains, NJ (US);

Assignee:

Agere Systems Guardian Corp., Orlando, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 7/00 ; G03F 7/20 ;
U.S. Cl.
CPC ...
G03F 7/00 ; G03F 7/20 ;
Abstract

A lithographic apparatus and process that utilizes dark-field imaging of mask features to introduce an image of those features into an energy sensitive resist material is disclosed. Dark field imaging is accomplished by utilizing off-axis illumination in combination with one or more masks. The zero-order off-axis illumination is lost from the system and is not captured from the downstream imaging optics. The mask or mask contains both lithographic features and non-imaged features. The non-imaged features are too small to be resolved by the imaging optics used to introduce the image into the energy sensitive material. The lithographic features and non-imaged features associated with a particular pattern feature are either present on the same mask, or decoupled where the non-imaged features are on one mask and the lithographic features are on a second mask.


Find Patent Forward Citations

Loading…