The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2002
Filed:
Dec. 17, 1998
Applicant:
Inventors:
Jenn-Tsair Tsai, Hsinchu, TW;
Bill Chen, Hsinchu, TW;
Assignee:
Mustek Systems, Inc., , TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04P 1/00 ;
U.S. Cl.
CPC ...
H04P 1/00 ;
Abstract
A method and an apparatus for obtaining a magnification error in a first direction for an image scanning apparatus is disclosed. The method includes steps of (a) providing a marking pattern having a particular length in the first direction, (b) scanning the marking pattern to obtain a scanning length in the first direction, and (c) calculating the magnification error in the first direction from scanning length and the particular length.