The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2002

Filed:

Dec. 18, 1996
Applicant:
Inventor:

Benjamin M. Cahill, III, Ringoes, NJ (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/00 ; H04N 7/08 ; H03L 7/00 ;
U.S. Cl.
CPC ...
H04N 7/00 ; H04N 7/08 ; H03L 7/00 ;
Abstract

Prior art methods of decoding a vertical blanking interval (VBI) scan line decoded each scan line within a given VBI using the same operational parameters, such as filter coefficients and run-in clock recovery parameters. The problem with these prior art methods is that each scan line was treated the same, even though certain scan lines within a given VBI typically exhibit different signal and content characteristics. The present invention provides for line-specific decoding of VBI scan lines. As such, each scan line within a given VBI is decoded using a set of operational parameters unique to that scan line number. These operational parameters are adjusted and maintained on a scan line by scan line basis.


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