The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2002
Filed:
Oct. 07, 1999
Yukio Ishigaki, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A propagation delay time measuring method is provided that is capable of easily and accurately measuring propagation delay times Tb and Tc of a drive signal path BL connected between a driver DR and an I/O pin of an IC under test and a response signal path BL connected between a comparator CP and the I/O pin of the IC under test, respectively, in a short time, wherein the drive signal path and the response signal path are formed to have the same length, a pulse is supplied to the drive signal path from the driver, and a timing when the pulse is outputted from the response signal path is detected, thereby to measure a total propagation delay time given to the pulse when the pulse has propagated through the drive signal path and the response signal path based on the detected timing, and a time duration equal to 1/2 of the measured propagation delay time is calculated and determined to be a propagation delay time of each of the drive signal path and the response signal path.