The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 2002
Filed:
Apr. 06, 1998
David L. Flannery, Englewood, OH (US);
Thomas P. Staub, Dayton, OH (US);
David R. Seitz, Vandalia, OH (US);
MDC Max Daetwyler AG, , CH;
Abstract
An error detection apparatus and method for use with engravers, such as gravure engravers. An error value E corresponding to the difference between a set of predetermined setup parameters and actual measurement of a portion of an engraved area on the cylinder is determined. The error value E is then used to adjust the engraver to engrave an actual cut or etch in accordance with the set of predetermined setup parameters. The error detection and correction system is suitable for providing a closed-loop system for engraving a cylinder. The apparatus and method may be used during initial setup or during normal operation of the engraver. A method is disclosed comprising the steps of engraving ink receptive cells in the surface of a rotating gravure printing cylinder consisting of the steps of generating a cell width command signal comprising a series of cell width commands, engraving the cells by using the cell width command signal to urge an engraving stylus into periodic engraving contact with the surface, measuring actual widths of cells which have been engraved as aforesaid, and adjusting the cell width command signal in correspondence with differences between the actual widths and the cell width commands.