The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2002
Filed:
Jan. 04, 1999
Ming-Hsiu Hsieh, Panchiao, TW;
Wen-Feng Wu, Chu Pei, TW;
Min-Huey Tsai, Hsinchu, TW;
Yao-Tung Liu, Hsinchu, TW;
Lieh-Chang Tai, Hsinchu, TW;
Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;
Abstract
A method for automatic scheduling of a production plan. The automatic scheduling system arranges different kinds of production plans and defines a first priority lot, a second priority lot and a normal lot in testing factories. The testing processes of the first priority lot is to decide the testing machine first, then exchanged with a running lot on this testing machine when a test piece is completed. For the second priority lot, after decides the testing machine, the second priority lot is exchanged with a running lot on the testing machine when the running lot is completed. For the normal lot, the procedure is to check if the testing machine is available and need to be setup, then use a setup reduce method to reduce the setup frequency if more than one machine is available and needs to be setup. The key to reduce setup method selects the testing machine which has minimum impact for the subsequent testing lot to get efficient use of the testing machine.