The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2002

Filed:

Apr. 14, 2000
Applicant:
Inventor:

Toshifumi Suganaga, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 9/00 ;
U.S. Cl.
CPC ...
G03F 9/00 ;
Abstract

A reticle for use in exposing a semiconductor capable of increasing the contrast of a resist pattern to be formed on a wafer through exposure without involvement of a change in the geometry of a diaphragm plate even when a circuit pattern formed on a reticle becomes more minute; a method of producing the reticle; and a semiconductor device. The irregularities are formed in the glass surface of the halftone reticle , thus enabling uniform diffusion of the illumination light over the glass surface . Consequently, the oblique incident light effective for improving the contrast of an image to be formed on the wafer can be readily and inexpensively increased without involvement of complicated processes. Even when the hole pattern becomes minute, the contrast of a resist pattern to be radiated on the wafer can be improved.


Find Patent Forward Citations

Suganaga, Toshifumi. (2002). Reticle for use in exposing semiconductor, method of producing the reticle, and semiconductor device (U.S. Patent No. 6352800). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6352800

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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