The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2002

Filed:

Nov. 15, 1999
Applicant:
Inventors:

An-Min Chiang, Hsin-Chu, TW;

Chi-Hsiang Lee, Hua-Lien, TW;

Wei-Kun Yeh, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/100 ;
U.S. Cl.
CPC ...
H01L 2/100 ;
Abstract

A method of forming an image sensor is disclosed. A partially processed semiconductor wafer is provide, containing p-type and/or n-type regions which are bounded by isolation regions and with gate oxide layers grown on the surfaces upon which gate electrode structures are disposed, some of said gate electrode structures will serve as gate electrodes of image sensor transistors. Ions are implanted to form source/drain structures about the said gate electrode structures, with an extended region for source drains bordering photodiode regions. Ions are implanted to form photodiodes, overlapping the extended bordering source drain regions. A blanket transparent insulating layer is deposited.


Find Patent Forward Citations

Chiang, An-Min. (2002). Method of manufacturing for cmos image sensor (U.S. Patent No. 6350127). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6350127

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…