The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2002

Filed:

Jun. 05, 1998
Applicant:
Inventors:

David L. Drake, San Diego, CA (US);

David J. Webster, Temecula, CA (US);

Assignee:

Intrusion.com, Inc., Richardson, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 9/00 ;
U.S. Cl.
CPC ...
H04L 9/00 ;
Abstract

A system for event detection employs a collector that collects raw audit data made up of raw audit data records at an audit source; a database; an inserter at a downstream processing location that inserts Virtual Records into the database, including both a first type of Virtual Record generated in response to a raw audit data record, and a second type of Virtual Record generated in response to a detected audit event; the inserter; a parser; coupled to the collector, that converts raw audit data records in the raw audit data into Virtual Records; a detector that detects audit events in response to the Virtual Records generated by the parser, and generates the second type of Virtual Record in the event an audit event is detected.

Published as:

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