The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2002
Filed:
Apr. 22, 1999
Applicant:
Inventors:
Srimat T. Chakradhar, Old Bridge, NJ (US);
Angela Krstic, San Diego, CA (US);
Kwang-Ting Cheng, Santa Barbara, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/100 ; G01R 3/128 ;
U.S. Cl.
CPC ...
G06F 1/100 ; G01R 3/128 ;
Abstract
At-speed strategies for testing high speed designs on slower testers. At-speed testing schemes is provided that integrates the tester's speed limitations with the test generation process. Due to constraints placed at the test generation process, these schemes might result in a reduced fault coverage. To increase the fault coverage and reduce the test application time, the slow-fast-slow and at-speed strategies can be combined for testing high speed designs on slower testers. A slow tester that uses test vectors that are generated while taking into account the speed of the tester.