The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2002

Filed:

Dec. 03, 1997
Applicant:
Inventors:

Masaki Souma, Yokohama, JP;

Kenji Nagao, Yokohama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

A system capable of pattern matching between a less noisy face image and a noisier face image obtained in different imaging conditions. A weighted sum of a covariance matrix calculated from less noisy sample images obtained for a plurality of sample faces and a covariance matrix calculated from differences between the less noisy sample images and corresponding noisier sample images obtained for the sample faces is first obtained. A principal component analysis is applied to the weighted sum to find and store in memory a result with which principal components are calculated from a given face image. In actual pattern matching, a first face image and a second face image are first obtained. The degree of similarity between the first and second face images is calculated based on a conventional formula by using the result of the principal component analysis. The matching between the first and second face images is achieved based on a comparison of the degree of similarity with a predetermined threshold value.


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