The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2002
Filed:
Dec. 26, 2000
Other;
Abstract
A repair analysis circuit for redundancy, a redundant method for repairing a redundant, and a semiconductor device that can shorten time for testing defective memory cells, that eliminate the need of failure memories having a huge capacity for storing defective bits to make the testing apparatus inexpensive, and that easily cope with increase and decrease in IO numbers. A large number of IO outputs MOUT are collectively compared with a specified expected value, and as a result resultant judgment information DOUT is outputted to an error information acquiring device and an analyzing device reads table information sequentially from each block to obtain replacing data, and the replacing data are outputted serially to the external tester through the external I/F circuit The redundant memory cell itself can be made to compare with a specified expected value in the same manner as other memory cells or the like. By outputting the result of determination can also be outputted to the error information acquiring device in the same manner as judgment information DOUT for other memory cells or the like, repair analysis can be performed without using any defective redundant memory cells.