The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2002
Filed:
Sep. 30, 1998
Applicant:
Inventors:
Jenn-Tsair Tsai, Hsinchu, TW;
Te-Chih Chang, Hsinchu, TW;
Assignee:
Mustek System, Inc., , TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/04 ;
U.S. Cl.
CPC ...
H04N 1/04 ;
Abstract
The present invention provides a control method for moving and positioning multiple lens of a scanner to their accurate position. The method mainly uses a linear reference image, such as a calibration paper with some marks in the scanning range, taken by a specific lens to a CCD for verifying if the lens is well positioned according to a decision rule. The lens is controlled to move to its correct position by the continuous feedback signals from the CCD, so the accuracy and reliability of the positioning can be kept without being influenced from any worn-out of frequent movements of the mechanism.