The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2002
Filed:
Oct. 20, 1999
Naoki Kawahara, Takatsuki, JP;
Kouichi Aoyagi, Takatsuki, JP;
Rigaku Industrial Corporation, Osaka, JP;
Abstract
A fluorescent X-ray analyzer includes a detector ( ) for detecting fluorescent X-rays ( ) emitted from a sample piece ( ) to be analyzed, and a first collimator ( ) disposed between the sample piece ( ) and the detector ( ) supported for movement between inserted and retracted positions with respect to a path of travel of the fluorescent X-rays ( ) towards the detector ( ). The first collimator ( ) comprises a wall ( ) adjacent the sample piece ( ) that is stepped to provide stepped wall segments ( ) having respective apertures ( ) of varying diameters defined therein. The smaller the aperture, the closer it is to the sample piece ( ) when one of the apertures ( ) is selected according to a size of a target area of the sample piece ( ) to be measured and is then brought in register with the path of travel of the fluorescent X-rays ( ) towards the detector ( ).