The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2002

Filed:

Jun. 04, 1999
Applicant:
Inventor:

Hai Xing Chen, Toronto, CA;

Assignee:

ACGT Medico, Inc., Toronto, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/3566 ; G01N 3/3558 ; C12Q 1/68 ; C07H 2/102 ; B01D 1/500 ;
U.S. Cl.
CPC ...
G01N 3/3566 ; G01N 3/3558 ; C12Q 1/68 ; C07H 2/102 ; B01D 1/500 ;
Abstract

Methods and apparatuses are disclosed for detecting the presence of a test material in a test sample. The test sample is introduced into a test column which has at least two snares. One of the snares has a control capture material for detection of the presence of control. Each of other snares has a capture material specific to a corresponding test material for which detection being sought. The capture material will bind with the corresponding test material to form a bound material. The test column is then washed to remove materials which have not been bound to the capture materials. Finally, the presence of bound materials is detected on each of the snares. The method is useful for detection of a pathogen indicator in a test sample, particularly suitable for detection of DNA and RNA.


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