The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2001
Filed:
May. 21, 1999
Applicant:
Inventors:
Hirotsugu Hashimoto, Ageo, JP;
Toyohiko Aoki, Ageo, JP;
Assignee:
Mitsui Mining & Smelting Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/300 ;
U.S. Cl.
CPC ...
G01N 1/300 ;
Abstract
A measurement device for measuring an internal quality of a fruit or vegetable with light is intended to be able to obtain the internal quality at higher speed and with accuracy. In the measurement device of the internal quality, transmitted light through the fruit or vegetable is split into a plurality of frequency regions and the measurement device is provided with a plurality of processing circuits for carrying out intensity data calculating operations simultaneously and in parallel for the respective frequency regions.