The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2001
Filed:
Oct. 19, 1999
Steven Hauptman, Camarillo, CA (US);
Teradyne, Inc., Boston, MA (US);
Abstract
An apparatus for testing and calibration in automated test equipment includes a time varying signal channel having a series-connected solid state switch interposed between a time varying signal circuit end and a device under test end of the time varying signal channel. A DC test channel is connected to the time varying signal channel between the series-connected solid state switch and the device under test end, and has at least one solid state switch interposed along the DC test channel to provide switchable coupling between a DC parametrics circuit side of the DC test channel and the time varying signal channel. A time varying signal level calibration channel is connected to the time varying signal channel between the series-connected solid state switch and the time varying signal circuit end, and has at least one solid state switch interposed along the signal level calibration to provide switchable coupling between a DC parametrics circuit side of the signal level calibration channel and the time varying signal channel. The time varying signal channel may have a low resistance type solid state switch, while the DC test channel, the signal level calibration channel, or both, may have low capacitance type solid state switches. Thus, opto-coupled MOSFETS, pin diodes, or other kind of solid state switches, may be utilized. The DC test channel, or the signal level calibration channel, or both, may have a force branch and a sense branch each having a solid state switch.