The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2001
Filed:
Dec. 18, 1997
Applicant:
Inventors:
Shang-Hong Lai, Plainsboro, NJ (US);
Ming Fang, Cranbury, NJ (US);
Assignee:
Siemens Corporate Research, Inc., Princeton, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ; G06K 9/62 ; G06K 9/68 ;
U.S. Cl.
CPC ...
G06K 9/00 ; G06K 9/62 ; G06K 9/68 ;
Abstract
A method for localization refinement of inspection patterns comprises the steps of providing a template image comprising pixels in a pattern, each pixel having an intensity, providing an input image having a same pattern of pixels as the template image and calculating an energy function by weighting a sum of modified optical flow constraints at locations of the pixels of both the template image and the input image to determine a shift and rotation between the pattern of the template image and the input image.