The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2001

Filed:

Feb. 22, 2001
Applicant:
Inventors:

Yoshiharu Anda, Okayama, JP;

Mitsuru Nishitsuji, Osaka, JP;

Katsuhiko Kawashima, Hyogo, JP;

Tsuyoshi Tanaka, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/100 ; H01L 2/184 ;
U.S. Cl.
CPC ...
H01L 2/100 ; H01L 2/184 ;
Abstract

An organic polymer film patterning method includes the steps of: defining a resist film on a selected area of a substrate; depositing an organic polymer film over the substrate by a plasma CVD process so that the resist film is covered with part of the organic polymer film; and removing the resist film along with the part of the organic polymer film that has covered the resist film.


Find Patent Forward Citations

Anda, Yoshiharu. (2001). Method of patterning organic polymer film and method for fabricating semiconductor device (U.S. Patent No. 6329227). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6329227

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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