The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2001
Filed:
Jan. 29, 1999
Applicant:
Inventor:
Andrew MacCormack, Bristol, GB;
Assignee:
STMicroelectronics Limited, Bristol, GB;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract
A circuit and method for scan testing some or all connections to a device, the device under test having at least one output and a plurality of inputs greater than the number of outputs. Such a device typically includes built-in self-test capability. An exclusive-OR gate receives the plurality of inputs and generates an exclusive-OR output. A multiplexer receives the at least one data output and the exclusive-OR as respect inputs, and selectively outputs one of such as a data output. Such selection of the output of the multiplexer is controlled responsive to a scan test signal, the exclusive-OR output being output from the multiplexer in a scan test.