The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2001
Filed:
Dec. 23, 1999
Gene Jay Martin, New Haven, CT (US);
Silicon Valley Group, Inc., Ridgefield, CT (US);
Abstract
A calcium fluoride (CaF,) stress plate provides a predetermined amount of optical delay. The CaF,stress plate has surfaces that lie in CaF,cubic planes, and delays an optical wavefront that is incident to a set of cubic planes along a transmission axis. To implement the desired delay, the CaF,stress plate has a first index of refraction that is seen by a first field component of the optical wavefront, and a second index of refraction that is seen by a second field component of the optical wavefront. The optical delay of the stress plate is proportional to the differences between the two indexes of refraction. Embodiments of the invention include a method of fabricating the CaF,stress plate from a sample of CaF,material. The method includes the step of determining the orientation of the cubic planes for the CaF,sample, as the sample is typically oriented along the cleave planes. Next, the sample is processed to generate a CaF,plate whose surfaces are oriented in CaF,cubic planes. Next, a compressive or tensile force is applied perpendicular to at least one pair of cubic plane surfaces and perpendicular to the transmission axis for the incident optical wavefront. The compressive/tensile force has the effect of changing the index of refraction for electromagnetic fields that are oriented along the direction of the force vector from the characteristic index of refraction for CaF,. After which, the CaF,stress plate effectively has two indexes of refraction, where the amount optical delay is proportional to the difference between the indexes of refraction. Next, the amount of optical delay is measured to determine if the measured delay is sufficiently close to the specified delay. If it is not, then more compression or stress can be applied until the desired delay is achieved. In alternate embodiment, shear forces are applied to the CaF,plate instead of compressive or tensile forces. The shear forces are applied along mechanical surfaces that are rotated 45 degrees to the CaF cubic planes of the plate. As with the compressive/tensile forces, the shear forces operate to change the index of refraction of the CaF,plate in the direction of a resultant force vector.