The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2001
Filed:
Apr. 27, 1998
Applicant:
Inventors:
Ilya Grodnensky, Foster City, CA (US);
Toshihiro Sasaya, San Mateo, CA (US);
Assignee:
Nikon Precision, Inc., Belmont, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 2/732 ; G03B 2/742 ; G03B 1/100 ;
U.S. Cl.
CPC ...
G03B 2/732 ; G03B 2/742 ; G03B 1/100 ;
Abstract
A method of characterizing photolithographic tool performance is presented. Variations in performance over an image or exposure field are evaluated and contributions to the variation due to the partial coherence factor of the tool separated from other contributing factors. Methods of determining the relative magnitude of these variations is provided and a photolithographic tool that incorporates these methods described.
Grodnensky, Ilya. (2001). Method of characterizing photolithographic tool performance and photolithographic tool thereof (U.S. Patent No. 6323938). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6323938
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile