The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2001

Filed:

Feb. 01, 2000
Applicant:
Inventors:

Tomoki Fukagawa, Amagasaki, JP;

Hiroshi Nishida, Mishima-gun, JP;

Masanori Ueno, Mishima-gun, JP;

Masateru Nose, Takaoka, JP;

Hideyasu Nagai, Mishima-gun, JP;

Fuminori Higami, Mishima-gun, JP;

Assignee:

Read-Rite Corporation, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/66 ;
U.S. Cl.
CPC ...
G11B 5/66 ;
Abstract

The present invention provides a spin-valve magnetic resistance sensor in which an underlayer, which has a second underlayer film with an fcc structure consisting of an alloy formed by combining one or more elements selected from a set consisting of elements of group VIIIa and group Ib of the periodic table, and one or more elements selected from a set consisting of elements of groups IIa, IVa, Va, VIa, IIb, Ib and IVb of the periodic table, such as NiFeCrTi or NiCrTi, etc., is formed on the substrate, and a magnetic resistance (MR) film which has an antiferromagnetic layer consisting of a Pt,Mn,alloy or an Ir,Mn,alloy is laminated on top of this underlayer. The composition ratio of the element with the smallest free energy of oxide formation among the elements contained in the alloy of the second underlayer film is in the range of 0.1 atomic % to 15 atomic %.


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