The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 2001

Filed:

Aug. 05, 1999
Applicant:
Inventors:

Chia-Lin Chu, Brookfield, WI (US);

Amit Sharma, Milwaukee, WI (US);

John C. Seymour, Jefferson, WI (US);

Assignee:

Quad/Tech, Inc., Sussex, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41F 3/102 ; B41L 4/702 ;
U.S. Cl.
CPC ...
B41F 3/102 ; B41L 4/702 ;
Abstract

A method is disclosed for determining ink key control settings for a plurality of ink keys in a printing press. Each of the ink keys controls the amount of ink supplied to a roller and then to a respective ink key zone on a substrate to print an image. A press model relates image requirements to ink key control settings. The press model includes a gain and a respective offset associated with each ink key. The offset represents the amount a value represented by the ink key control setting varies from the actual ink key opening. The drift in the respective offsets of the ink keys is tracked by comparing control settings predicted by the press model with final control settings after a press job has been satisfactorily completed.


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