The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2001
Filed:
Jan. 05, 1999
Suraj Rao, Dallas, TX (US);
Sharad Saxena, Richardson, TX (US);
Pushkar P. Apte, Dallas, TX (US);
Purnendu K. Mozumder, Plano, TX (US);
Richard Gene Burch, McKinney, TX (US);
Karthik Vasanth, Dallas, TX (US);
Joseph Carl Davis, Allen, TX (US);
Chenjing L. Fernando, Willoughby, OH (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
Method for adequately modeling process induced variabilities is disclosed that comprises the steps of acquiring experimental data and defining a particular design space. Values for the mean and standard deviation of the experimental data at each of the points defining the design space are calculated. The experimental values of the output parameters at each of the design points is normalized to extract the shape of the distribution of each of the design points. The normalized values are then merged to form a cumulative distribution function associated with the data. The cumulative distribution function is applied to a new design point in a predicted fashion by first calculating a mean and standard deviation value for the new point by interpolating from the mean and standard deviation values from the experimental data. The cumulative distribution function is then scaled and centered using the interpolated mean and standard deviation values to provide a predicted data distribution for the new design point.