The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2001

Filed:

Apr. 23, 1999
Applicant:
Inventors:

Tsutomu Shoki, Tokyo, JP;

Akinori Kurikawa, Yamanashi, JP;

Takamitsu Kawahara, Kanagawa, JP;

Ryo Ohkubo, Tokyo, JP;

Assignee:

Hoya Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 9/00 ; H01L 2/1027 ;
U.S. Cl.
CPC ...
G03F 9/00 ; H01L 2/1027 ;
Abstract

An X-ray mask including a mask support formed into the shape of a frame, an X-ray-transparent film which is supported so as to extend over the surface of the frame-shaped mask support and which permits transmission of X-rays, and a desired X-ray-absorbing film pattern laid on the X-ray-transparent film, wherein the mask support has a thickness which by itself affords sufficient mechanical strength; and a step is formed along the periphery of the mask support.


Find Patent Forward Citations

Shoki, Tsutomu. (2001). Method of manufacturing x-ray mask and x-ray mask blank, and x-ray mask and x-ray mask blank manufactured thereby (U.S. Patent No. 6317480). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6317480

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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