The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2001
Filed:
Jan. 05, 2000
Applicant:
Inventors:
Assignee:
Mitutoyo Corporation, Kanagawa-ken, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/012 ;
U.S. Cl.
CPC ...
G01B 7/012 ;
Abstract
A contact location detecting mechanism (,) of a touch signal probe (,) includes a rotary motion generator (,) for scanningly moving a stylus (,) on a plane (A), a phase value detector (,) for detecting a phase value (&thgr;) indicating a rotation position of the scanning rotary motion, and a contact location detector (,for detecting a contact location of a contact portion (,A) based on a detection signal value (V) detected by the detector (,B) and the phase value (&thgr;). Since the contact location of the contact portion (,A) can be detected by the contact location detector (,), the touch signal probe (,) can be used for a profiling measurement and continuous measurement of a workpiece.