The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2001

Filed:

Dec. 20, 1999
Applicant:
Inventors:

An-Min Chiang, Hsin-Chu, TW;

Chi-Hsiang Lee, Hua-Lien, TW;

Wei-Kun Yeh, Hsin-Chu, TW;

Hua-Yu Yang, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/100 ;
U.S. Cl.
CPC ...
H01L 2/100 ;
Abstract

A process of fabricating an image sensor cell, on a semiconductor substrate, with the image sensor cell exhibiting low dark current generation, and high signal to noise ratio, has been developed. The process features the use of a photoresist shape, used to protect a previously formed photodiode element, from an reactive ion etching procedure, used to define insulator spacers on the sides of a polysilicon gate structure, of a reset transistor structure This process sequence avoids damage to the surface of an N type component, of the photodiode element, resulting in the improved electrical characteristics, when compared to counterpart image sensor cells, in which the photodiode element was subjected to the insulator spacer definition procedure.


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