The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2001
Filed:
Nov. 09, 1998
Atsumi Kaneko, Tokyo, JP;
Masato Hara, Tokyo, JP;
Toshihiro Nakayama, Saitama, JP;
Atsushi Kida, Saitama, JP;
Shigeru Wakashiro, Tokyo, JP;
Asahi Kogaku Kogyo Kabushiki Kaisha, Tokyo, JP;
Abstract
A photogrammetric measurement system produces a survey map based on a set of photographed pictures obtained at two different photographing positions. Each of the pictures includes at least one continuous line and at least three conspicuous points away from the continuous line, with at least one of the conspicuous points and remaining conspicuous points being placed at opposing sides of the continuous line. The set of pictures are produced as a first picture and a second picture. First lines are produced between the conspicuous points on the first picture such that the lines intersect the continuous line, thereby generating intersecting points. Second lines are produced between the conspicuous points on the second picture such that the lines intersect the continuous line, thereby generating further intersecting points. A set of corresponding intersecting points are designated on the first and second pictures, and intersecting points are produced on the survey map based on the designated corresponding intersecting points. A line, connecting the intersecting points, is thus produced on the survey map.