The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2001

Filed:

Jun. 29, 1998
Applicant:
Inventors:

Giuseppe Queirolo, Milan, IT;

Giampiero Ottaviani, Modena, IT;

Gianfranco Cerofolini, Milan, IT;

Assignee:

STMicroelectronics S.r.l., Agrate Brianza, IT;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/130 ;
U.S. Cl.
CPC ...
H01L 2/130 ;
Abstract

A process for cutting a trench in a silicon monocrystal in areas defined by a mask comprises forming a mask that defines an etched area on the surface of a monocrystalline silicon wafer which is eventually covered by a thin layer of oxide. Next, ions are implanted with a kinetic energy and in a dose sufficient to amorphize the silicon down to a predefined depth within the defined area, while maintaining the temperature of the wafer sufficiently low to prevent relaxation of point defects produced in the silicon and to prevent diffusion of the implanted ions in the crystal lattice of the silicon adjacent to the amorphized region. Dislodgment and expulsion of the amorphized portion in correspondence with interface with the adjacent crystal lattice of the silicon is initiated by heating the implanted wafer.


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