The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2001
Filed:
Dec. 13, 1999
Applicant:
Inventors:
Jun Ohtani, Hyogo, JP;
Mitsuhiro Hamada, Hyogo, JP;
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/00 ;
U.S. Cl.
CPC ...
G11C 7/00 ;
Abstract
In a semiconductor device including banks A and B, testing and redundancy analysis of the bank B are first carried out by using a conventional tester, and redundancy replacement is carried out. Then, the bank A is tested by a BIST circuit and the test result of each bit is written to the bank B. By using the bank B as a memory for defect analysis, a tester connected to the semiconductor device while testing the bank A does not need a large capacity analysis memory. Thus, an inexpensive redundancy analysis system can be provided.