The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2001
Filed:
Sep. 30, 1998
Kazuyuki Maruo, Sendai, JP;
Advantest Corporation, Tokyo, JP;
Abstract
There is provided an image information processing apparatus capable of detecting a defect on a device even from an unclear SEM image thereof, and without using a golden device or a CAD data, at high speed. A two dimensional Wavelet transform is applied to an input digital image data. A threshold value process (a binarization process) is then applied to longitudinal line detection components and lateral line detection components obtained by the two dimensional Wavelet transform to create respective binarization images of the longitudinal line detection components and the lateral line detection components. A Hough transform is applied to each binarization image to obtain a position and a size of an object to be detected. If a threshold value process is applied to an image in a parameter space obtained by the Hough transform, a detection of particular figure information becomes easy. With respect to the binarization image, active pixels are grouped such that the same label is given to adjacent active pixels. A position and a size of an object to be detected can automatically be specified by finding center of gravity coordinates of each of the labels.