The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2001
Filed:
Jul. 28, 1998
Applicant:
Inventors:
William J. Antheunisse, Rowlett, TX (US);
Joseph W. Whitaker, Richardson, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02H 3/05 ;
U.S. Cl.
CPC ...
H02H 3/05 ;
Abstract
A testing system includes a testing hardware subsystem which can perform testing under a plurality of testing modes. Each testing mode corresponds to the operation of a particular version of a tester. A control subsystem is coupled to the testing hardware subsystem. The control subsystem can direct the testing hardware subsystem to test under one of the plurality of testing modes at a given moment.
Antheunisse, William. (2001). Method and test system for testing under a plurality of test modes (U.S. Patent No. 6289472). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6289472
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