The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2001

Filed:

Mar. 29, 2000
Applicant:
Inventor:

Yuh-Sheng Chern, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/1336 ;
U.S. Cl.
CPC ...
H01L 2/1336 ;
Abstract

The invention discloses a method of forming threshold voltage adjustment for MOS transistors. At first, a first oxide layer and a nitride layer are formed on a silicon substrate in sequence. Next, shallow trenches and active regions are formed by using photolithography and dry etching technology. A wet etching step is performed to remove part of the nitride layer, and then the first ion implantation for threshold voltage adjustment are performed. After accomplishing shallow trench isolations, the second ion implantation for threshold voltage adjustment are finally performed.


Find Patent Forward Citations

Chern, Yuh-Sheng. (2001). Method of performing threshold voltage adjustment for mos transistors (U.S. Patent No. 6287921). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6287921

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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