The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2001
Filed:
Jun. 02, 1998
Applicant:
Inventor:
Jun Fukuda, Kawasaki, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/06 ;
U.S. Cl.
CPC ...
G01R 1/06 ;
Abstract
A semiconductor device test board for performing a test on a semiconductor device includes a supporting board formed of an insulating material and contact parts which are formed on the supporting board, and which can be connected to solder bumps formed on a semiconductor device to be tested. Each of the contact parts includes contact base layers formed of conductive materials other than solder and a solder layer having a thin-film shape, and covering the contact base layers.
Fukuda, Jun. (2001). Semiconductor device test board and a method of testing a semiconductor device (U.S. Patent No. 6281693). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6281693
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile