The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2001
Filed:
Jan. 28, 1999
Jenn-Tsair Tsai, Hsinchu, TW;
Bill Chen, Hsinchu, TW;
Mustek Systems, Inc., , TW;
Abstract
A fast and effective method and an apparatus are provided for obtaining relative and absolute magnifying factors in the transverse and longitudinal directions to improve the scanning quality. The method for obtaining relative modifying factors includes the steps of (a) providing a first line segment, which extends in a direction other than either one of the first direction and the second direction, having a plurality of scanning points wherein there is a specific functional relationship between a distance in the first direction and a distance in the second direction of any two of the scanning points, (b) scanning the first line segment at a first one of the scanning points, (c) scanning the first line segment at a second one of the scanning points, wherein the first and the second scanning points have a particular position distance in the first direction, (d) obtaining a scanning distance between the first and the second scanning points in the second direction from the image scanning apparatus, and (e) calculating a relative modifying factor from the scanning distance and the particular position distance according the specific functional relationship. The method further provides a second line segment for obtaining an absolute magnifying factor in one of the first and second directions.