The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2001
Filed:
May. 14, 1999
Masao Nagano, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
There are provided a frequency analysis method permitting a frequency analysis to be performed at a high rate and a sweep type spectrum analyzer using such frequency analysis method. In the case of multiplying a signal to be measured by a main swept frequency signal; extracting the result of the multiplication through an intermediate frequency filter having a predetermined bandwidth to extract frequency components included in the signal to be measured as intermediate frequency signals; and analyzing the frequency components included in the signal to be measured based on the correspondence relation between a power of each of the intermediate frequency signals and a frequency of the main swept frequency signal, an inverse swept signal is multiplied by each intermediate frequency signal, the inverse swept signal being frequency-swept in the reverse direction to the frequency transition direction of the associated intermediate frequency signal, and a constant frequency component obtained from the results of the multiplications is extracted as a frequency spectrum included in the signal to be measured.